Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1998-04-10
2000-02-08
Utech, Benjamin
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438740, 438743, 438744, H01L 21311
Patent
active
060228105
ABSTRACT:
An interconnection layer 3 in a floating state and an interlayer insulating film 6 are formed on a semiconductor substrate. A connection hole 4 penetrating the interlayer insulating film and the interconnection layer is formed by dry etching with fluorocarbon. Filled in the connection hole is a conductive member 5 which is electrically connected to the interconnection layer. Accordingly, an improved method for manufacturing a semiconductor device offering a reduced contact resistance even for an extremely small contact hole is obtained.
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Iida Satoshi
Kusumi Yoshihiro
Yokoi Takahiro
Champagne Donald L.
Mitsubishi Denki & Kabushiki Kaisha
Utech Benjamin
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