Method of manufacturing semiconductor device

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438335, 438341, H01L 21331

Patent

active

061566179

ABSTRACT:
When a bipolar transistor having a buried layer is formed, the withstanding pressure of the bipolar transistor is deteriorated by upward diffusion to a great extent from the buried layer. When a buried layer is formed in a semiconductor substrate, by providing a region without impurity introduction, upward diffusion from the buried layer is controlled to prevent deterioration in the withstanding pressure.

REFERENCES:
patent: 5254486 (1993-10-01), Alter
patent: 5719082 (1998-02-01), Violette
patent: 5976940 (1999-11-01), Gomi et al.
patent: 5994162 (1999-11-01), Burghartz et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-960978

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.