Method of manufacturing semiconductor device

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Insulative housing or support

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S106000, C438S108000, C438S612000, C438S613000, C257S778000, C257S786000, C257S737000, C257SE21511

Reexamination Certificate

active

07901997

ABSTRACT:
A solder14is formed, by a plating method, on a connecting surface21A and a side surface21B in a connecting pad21of a wiring board11which is opposed to a metal bump13formed on an electrode pad31of a semiconductor chip12, and subsequently, the solder14is molten to form an accumulated solder15taking a convex shape on the connecting surface21A of the connecting pad21and the metal bump13is then mounted on the connecting surface21A of the connecting pad21on which the accumulated solder is formed, and the accumulated solder15and the metal bump13are thus bonded to each other.

REFERENCES:
patent: 2003/0001286 (2003-01-01), Kajiwara et al.
patent: 2006/0065978 (2006-03-01), Nishiyama et al.
patent: 2006/0201997 (2006-09-01), Tung
patent: 2006/0279000 (2006-12-01), Chang et al.
patent: 2009/0302450 (2009-12-01), Ohde et al.
patent: 8-148496 (1996-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2673849

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.