Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1990-08-23
1991-10-29
McCamish, Marion E.
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
427 541, 522164, 528350, 528352, 528353, B05D 104, B05D 306, C08J 328, C08G 6926
Patent
active
050615092
ABSTRACT:
A polyimide thin film is formed on a substrate by imparting energy under vacuum, by means of heating, ultraviolet light or electron beam irradiation, or a combination thereof, to a polyimide having in the polymer main chain imide bonds and decomposable bonds such as carbon-carbon single bond differing from the imide bonds so as to break the decomposable bonds.
REFERENCES:
patent: 3686022 (1972-08-01), White et al.
patent: 4590103 (1986-05-01), Ahne et al.
Aoki Shin'ya
Naito Katsuyuki
Nakayama Toshio
Chapman Mark A.
Kabushiki Kaisha Toshiba
McCamish Marion E.
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