Method of manufacturing optical device and inspection gauge...

Details Method of manufacturing optical device and inspection gauge... Method of manufacturing optical device and inspection gauge...

2006-01-10

2006-01-10

Fulton, Christopher W. (Department: 2859)

Geometrical instruments

Miscellaneous

Light direction

C033S563000

Reexamination Certificate

active

06983544

ABSTRACT:
A rectangular transparent sheet15is printed with black dotted density patterns21and22. Each dot of the patterns21and22is 30 μm in size while dotted area occupied rates of the patterns21and22range from 3% to 45%. The density patterns21and22are used for density level assessment of unevenness on a flat panel display device as standard references. Such density level assessment is carried out by comparing the unevenness with the patterns21and22or by visual inspection with the latter placed on the former.

REFERENCES:
patent: 1621991 (1927-03-01), Mayer
patent: 3109239 (1963-11-01), Wicker et al.
patent: 3266162 (1966-08-01), Burke
patent: 5060388 (1991-10-01), Nys
patent: 6457250 (2002-10-01), Mingus et al.

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