Method of manufacturing nitride semiconductor device

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S106000, C257SE21172, C257SE21222

Reexamination Certificate

active

07378351

ABSTRACT:
A nitride semiconductor device is manufactured by the step of forming a nitride semiconductor layer form on a GaN substrate main surface, the step of polishing a back surface of the GaN substrate formed with the above-mentioned nitride semiconductor layer, the step of dry etching the back surface of the GaN substrate subjected to the above-mentioned polishing by using a gas mixture of chlorine and oxygen, and the step of forming an n-type electrode on the back surface of the GaN substrate subjected to the above-mentioned dry etching.

REFERENCES:
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patent: 6890779 (2005-05-01), Toda et al.
patent: 2004/0229390 (2004-11-01), Seo
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patent: 2003-347660 (2003-12-01), None
patent: 2003347660 (2003-12-01), None
patent: 2004-6718 (2004-01-01), None
patent: 2004-71657 (2004-03-01), None
Hui-Ching Hsin et al. (Journal of Material Science: Materials in Electronics 13 (2002) 203-206).

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