Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2008-05-27
2008-05-27
Norton, Nadine G. (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S106000, C257SE21172, C257SE21222
Reexamination Certificate
active
07378351
ABSTRACT:
A nitride semiconductor device is manufactured by the step of forming a nitride semiconductor layer form on a GaN substrate main surface, the step of polishing a back surface of the GaN substrate formed with the above-mentioned nitride semiconductor layer, the step of dry etching the back surface of the GaN substrate subjected to the above-mentioned polishing by using a gas mixture of chlorine and oxygen, and the step of forming an n-type electrode on the back surface of the GaN substrate subjected to the above-mentioned dry etching.
REFERENCES:
patent: 6791120 (2004-09-01), Toda et al.
patent: 6890779 (2005-05-01), Toda et al.
patent: 2004/0229390 (2004-11-01), Seo
patent: 11186605 (1999-07-01), None
patent: 3398896 (2003-04-01), None
patent: 2003-347660 (2003-12-01), None
patent: 2003347660 (2003-12-01), None
patent: 2004-6718 (2004-01-01), None
patent: 2004-71657 (2004-03-01), None
Hui-Ching Hsin et al. (Journal of Material Science: Materials in Electronics 13 (2002) 203-206).
Abe Yuji
Kawasaki Kazushige
Kawazu Zempei
Oishi Toshiyuki
Shiozawa Katsuomi
Dahimene Mahmoud
Mitsubishi Denki & Kabushiki Kaisha
Norton Nadine G.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
LandOfFree
Method of manufacturing nitride semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of manufacturing nitride semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing nitride semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2811812