Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2011-04-26
2011-04-26
Vinh, Lan (Department: 1713)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S706000, C438S725000, C216S041000, C430S310000
Reexamination Certificate
active
07932183
ABSTRACT:
A method of manufacturing a multilayer thin film pattern includes forming a metal film over a substrate, forming a second thin film over the metal film, forming a resist pattern over the second thin film, etching the second thin film using the resist pattern as a mask, transforming the resist pattern using an organic solvent or a RELACS agent to cover an edge face of the etched second thin film and etching the metal film while the edge face of the second thin film is covered with the resist pattern.
REFERENCES:
patent: 6008065 (1999-12-01), Lee et al.
patent: 6195140 (2001-02-01), Kubo et al.
patent: 6933989 (2005-08-01), Oke et al.
patent: 6977219 (2005-12-01), Frost et al.
patent: 7338911 (2008-03-01), Kido
patent: 2004/0004686 (2004-01-01), Ogawa et al.
patent: 2005/0164459 (2005-07-01), Young
patent: 11-101992 (1999-04-01), None
patent: 11-345974 (1999-12-01), None
patent: 2002-110631 (2002-04-01), None
patent: 2003-255378 (2003-09-01), None
patent: 2004-294804 (2004-10-01), None
patent: 2005-215277 (2005-08-01), None
patent: 2005-275323 (2005-10-01), None
patent: 2006-41265 (2006-02-01), None
U.S. Appl. No. 12/432,320, filed Apr. 29, 2009, Miyamoto, et al.
Hayashi Masami
Itoh Yasuyoshi
Mitsubishi Electric Corporation
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Vinh Lan
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