Method of manufacturing multilayer thin film pattern and...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S706000, C438S725000, C216S041000, C430S310000

Reexamination Certificate

active

07932183

ABSTRACT:
A method of manufacturing a multilayer thin film pattern includes forming a metal film over a substrate, forming a second thin film over the metal film, forming a resist pattern over the second thin film, etching the second thin film using the resist pattern as a mask, transforming the resist pattern using an organic solvent or a RELACS agent to cover an edge face of the etched second thin film and etching the metal film while the edge face of the second thin film is covered with the resist pattern.

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U.S. Appl. No. 12/432,320, filed Apr. 29, 2009, Miyamoto, et al.

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