Method of manufacturing GaN crystals and GaN crystal...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Havin growth from molten state

Reexamination Certificate

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C117S045000, C117S078000, C117S079000, C117S082000, C117S083000

Reexamination Certificate

active

10884386

ABSTRACT:
The present invention provides a manufacturing method in which high quality GaN crystals and GaN crystal substrates can be manufactured under mild conditions of low pressure and low temperature. In a method of manufacturing GaN crystals in which in a gas atmosphere containing nitrogen, gallium and the nitrogen are allowed to react with each other to generate GaN crystals in a mixed melt of the gallium and sodium, the gallium and the nitrogen are allowed to react with each other under a pressurizing condition that exceeds atmospheric pressure, and pressure P1(atm(×1.013×105Pa)) of the pressurizing condition is set so as to satisfy the condition that is expressed by the following conditional expression (I):in-line-formulae description="In-line Formulae" end="lead"?P≦P1<(P+45),  (I)in-line-formulae description="In-line Formulae" end="tail"?where in the expression (I), P (atm(×1.013×105Pa)) denotes the minimum pressure that is required for generating GaN crystals at a temperature T° C. of the mixed melt.

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