Communications: electrical – Selective – Interrogation response
Patent
1997-10-20
2000-08-15
Zimmerman, Brian
Communications: electrical
Selective
Interrogation response
361749, 361750, 361751, 174254, 29846, H04Q 522
Patent
active
061042803
ABSTRACT:
A method of manufacturing and testing an electronic circuit, the method comprising forming a plurality of conductive traces on a substrate and providing a gap in one of the conductive traces; attaching a circuit component to the substrate and coupling the circuit component to at least one of the conductive traces; supporting a battery on the substrate, and coupling the battery to at least one of the conductive traces, wherein a completed circuit would be defined, including the traces, circuit component, and battery, but for the gap; verifying electrical connections by performing an in circuit test, after the circuit component is attached and the battery is supported; and employing a jumper to electrically close the gap, and complete the circuit, after verifying electrical connections. An electronic circuit comprising a substrate; a plurality of conductive traces on the substrate, with a gap in one of the conductive traces; a circuit component attached to the substrate and coupled to at least one of the conductive traces; a battery supported on the substrate and coupled to at least one of the conductive traces, wherein a completed circuit would be defined, including the traces, circuit component, and battery, but for the gap; and a jumper electrically closing the gap and completing the circuit, the jumper comprising conductive epoxy.
REFERENCES:
patent: 4075632 (1978-02-01), Baldwin et al.
patent: 4659872 (1987-04-01), Dery et al.
patent: 4926182 (1990-05-01), Ohta et al.
patent: 5099090 (1992-03-01), Allan et al.
patent: 5156772 (1992-10-01), Allan et al.
patent: 5220488 (1993-06-01), Denes
patent: 5621412 (1997-04-01), Sharpe et al.
patent: 5649296 (1997-07-01), MacLellan et al.
Lake Rickie C.
Medlen Curtis M.
Tuttle Mark E.
Dalencourt Yves
Micro)n Technology, Inc.
Zimmerman Brian
LandOfFree
Method of manufacturing and testing an electronic device, and an does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of manufacturing and testing an electronic device, and an, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing and testing an electronic device, and an will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2011277