Method of manufacturing an optical probe element

Details Method of manufacturing an optical probe element Method of manufacturing an optical probe element

1995-05-26

1998-06-16

Fuller, Benjamin R.

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347257, B41J 247, G01D 1534, G02B 2600, G02B 2700

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057678910

ABSTRACT:
An optical probe element for focusing light from a light source into micro light of a diameter not larger than the diffraction limit, includes a light transmitting flat substrate and an optical probe formed on one of the surfaces of the flat substrate. The optical probe has a substantially conical light transmitting projection, and a reflective film which covers the conical surface of the projection so that the tip of the projection is exposed. The optical probe element enables the optical probe to be formed on the flat substrate using a semiconductor processing technique, thereby achieving efficient mass production of a standardized optical probe element. Thus, a recording and reproduction apparatus using the optical probe element is efficiently mass-produced.

REFERENCES:
patent: 5247392 (1993-09-01), Plies
patent: 5294790 (1994-03-01), Ohta et al.
"Near-Field Optics: Microscopy, Spectroscopy and Surface Modification Beyond the Diffraction Limit", Betzig, et al., Science, vol. 257, pp. 189-195. Jul. 10, 1992.
"Near-field magneto-optics and high density data storage", Betzig, et al., Appl. Phys. Lett., vol. 61, No. 2, 13 Jul. 1992.

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