Method of manufacturing an insulated gate type field effect semi

Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal

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148 15, 357 23, H01L 2122

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active

040393585

ABSTRACT:
A method of manufacturing an insulated gate type field effect semiconductor device, wherein before an oxide film for the gate is formed, the surface portion of the silicon substrate is removed which includes defect such as scar, crack, distortion, dislocation or the like which tends to cause pin-holes to be formed in said oxide film.

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patent: 3893152 (1975-07-01), Lin
patent: 3926715 (1975-12-01), Sussmann
patent: 3986903 (1976-10-01), Watrous
Trans. of the Met. Soc. of A.I.M.E., vol. 233, Mar. 1965, pp. 596-602.

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