Method of manufacturing an insulated gate field-effect transisto

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29578, 29590, 29591, 148187, 148188, 357 23, 357 59, 357 71, H01L 21225, H01L 21283

Patent

active

043172768

ABSTRACT:
A method of manufacturing a device in a wafer with a P-type semiconductor, includes forming on a surface of the semiconductor body a layer of silicon dioxide doped with an N-type dopant. The portion of the doped silicon dioxide covering the interconnect work site area is removed and a masking layer of an oxidation impervious medium is formed over the wafer and thereafter removed from the field areas, as is the doped silicon dioxide layer. A thin layer of gate oxide is formed over the field areas. A layer of conductive polysilicon is formed over the entire wafer followed by a layer of oxygen impervious masking medium. The conductive polysilicon and masking medium layers are removed from all areas of the wafer except those whereat transistors are to be formed. The wafer is exposed to an oxidizing environment under an elevated temperature producing a field oxide over the exposed gate oxide. The elevated temperature of this operation drives the dopant in the doped silicon oxide layer into the semiconductor body forming doped source/drain regions and doped first level conductor runs. Thereafter the masking medium covering the interconnect work site area is removed and the work site area diffused with an N-type dopant. Finally, second level conductor runs are formed on the wafer.

REFERENCES:
patent: 3479234 (1969-11-01), Gray
patent: 3541676 (1970-11-01), Brown
patent: 3574010 (1971-04-01), Brown
patent: 3747200 (1973-07-01), Rutledge
patent: 4041518 (1977-08-01), Shimizu et al.
patent: 4160683 (1979-07-01), Roche
patent: 4192059 (1980-03-01), Khan et al.
patent: 4219925 (1980-09-01), Heeren

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing an insulated gate field-effect transisto does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing an insulated gate field-effect transisto, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing an insulated gate field-effect transisto will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-55556

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.