Optical: systems and elements – Diffraction – Using fourier transform spatial filtering
Patent
1993-12-30
1995-01-03
Ben, Loha
Optical: systems and elements
Diffraction
Using fourier transform spatial filtering
359559, 430 5, 430 15, 356237, G02B 2746, G01B 900
Patent
active
053791509
ABSTRACT:
A spatial frequency filter used in a pattern defect detection device, including a pattern which includes a black spot having a diameter expanded by a controlled amount in comparison with the diameter of a black spot on a photosensitive plate obtained by exposure by diffracted light from a pattern on a model specimen.
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Kosaka Nobuyuki
Miyazaki Yoko
Ohshige Toyomi
Tanaka Hitoshi
Tomoda Toshimasa
Ben Loha
Jr. John Juba
Mitsubishi Denki & Kabushiki Kaisha
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