Method of manufacturing a semiconductor nanoparticle

Coating processes – Particles – flakes – or granules coated or encapsulated – Inorganic base

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C427S212000, C427S216000

Reexamination Certificate

active

07838069

ABSTRACT:
A reaction in which a surface-treating material for providing a semiconductor nanoparticle with one or more kinds of electron-releasing groups is added and in which the electron-releasing groups are arranged on the surface of the semiconductor nanoparticle is accelerated by irradiating the semiconductor nanoparticle with light during surface modification, thereby reducing the reaction time.

REFERENCES:
patent: 6251303 (2001-06-01), Bawendi et al.
patent: 6977182 (2005-12-01), Sato et al.
patent: 7329369 (2008-02-01), Sato et al.
patent: 2001/0019806 (2001-09-01), Sato et al.
patent: 1 333 064 (2003-01-01), None
patent: 1 384 757 (2003-07-01), None
patent: 2005-105155 (2003-09-01), None
patent: WO 00/17655 (1999-09-01), None
Torimoto et al., “Characterization of Ultrasmall CdS Nanoparticles Prepared by the Size-Selective Photoetching Technique,” J. Phys. Chem. B 2001, 105, pp. 6838-6845.
Gaponik et al., “Thiol-Capping of CdTe Nanocrystals: An Alternative to Organometallic Synthesis Routes,” J. Phys. Chem. B 2002, 106, 7177-85.
Masahide Miyake et al., “Photoelectrochemical Characterization of Nearly Monodisperse CdS Nanoparticles—Immobilized Gold Electrodes”, Langmuir, vol. 15, No. 4, 1999, pp. 1503-1507.
Tsukasa Torimoto et al., “Characterization of Ultrasmall CdS Nanoparticles Prepared by the Size-Selective Photoetching Technique”, J. Phys, Chem. B, vol. 105, 2001, pp. 6838-6845.
European Search Report dated Oct. 25, 2007.
Japanese Patent Office Notice of Reasons for Rejection for Japanese Application No. 2004-025250, mailed Jun. 24, 2008, in Japanese.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a semiconductor nanoparticle does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a semiconductor nanoparticle, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a semiconductor nanoparticle will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4169588

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.