Method of manufacturing a semiconductor device with polysilicon

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 31, 437 60, 437918, 437191, 437193, H01L 21265

Patent

active

048928399

ABSTRACT:
A method of manufacturing a semiconductor device in which a base of a second conductivity type is provided in a semiconductor substrate of a first conductivity type, which operates as a collector. An emitter of the first conductivity type is provided in the base, a pn junction between the collector and the base is exposed on the surface of the semiconductor substrate, and the emitter is provided with stabilizing resistors. The method comprises the steps of providing a silicon oxide film over the entire surface of the semiconductor device, and a polysilicon film over both the emitter and a first portion of the pn junction exposed on the surface of the semiconductor substrate, and impurities are diffused into only a second portion of the polysilicon film located over the emitter to reduce the resistance of the second portion of the polysilicon film.

REFERENCES:
patent: 3463977 (1969-08-01), Grove et al.
patent: 3570114 (1971-03-01), Bean et al.
patent: 3576478 (1971-04-01), Wakins
patent: 3902188 (1975-08-01), Jacobson
patent: 4124933 (1978-11-01), Nicholas
patent: 4178674 (1979-12-01), Liu et al.
patent: 4234357 (1980-11-01), Scheppele
patent: 4244001 (1981-01-01), Ipu
patent: 4270137 (1981-05-01), Coe
patent: 4411708 (1983-10-01), Winhan
patent: 4451328 (1984-05-01), Dubois
patent: 4464825 (1984-08-01), Ports
patent: 4466839 (1984-08-01), Dathe et al.
patent: 4467519 (1984-08-01), Glang et al.
patent: 4569123 (1986-02-01), Ishii et al.
patent: 4602421 (1986-07-01), Lee et al.
patent: 4612563 (1986-09-01), Macdougall et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a semiconductor device with polysilicon does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a semiconductor device with polysilicon , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a semiconductor device with polysilicon will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-145414

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.