Method of manufacturing a semiconductor device having a monocrys

Fishing – trapping – and vermin destroying

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437 49, 437101, 437233, H01L 21265

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active

053607562

ABSTRACT:
According to a method of manufacturing a semiconductor device, a monocrystal silicon layer can be formed easily without adversely affecting semiconductor elements. In the method of manufacturing the semiconductor device, a first polysilicon layer is formed on a gate oxide film layer on a silicon substrate, and then a resist is formed on a predetermined region of the first polysilicon layer. Using the resist as a mask, anisotropic etching is effected to expose the surface of the silicon substrate. Thereby, it is not necessary to form the resist directly on the gate oxide film layer, as is done in the prior art, and it is possible to prevent impurity such as sodium or phosphorus in the resist from entering the gate oxide film layer. Consequently, it is possible to prevent a disadvantage such as change of a threshold voltage of a memory cell transistor, which may be caused by the entry of impurity.

REFERENCES:
patent: 4748133 (1988-05-01), Griswold
patent: 4868619 (1989-09-01), Mukherjee et al.

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