Method of manufacturing a semiconductor device

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

156643, 427 39, 427 82, 427 94, H01L 21318

Patent

active

046456830

ABSTRACT:
A method of manufacturing a semiconductor device is provided in which a surface of a substrate containing gallium and arsenic is treated in a first plasma containing hydrogen, and then, is coated with a layer of silicon nitride in a second plasma containing silicon and nitrogen. According to the invention, arsenic is added to the first plasma in the form of arsine. Further, the substrate is heated to a temperature below 450.degree. C. during such treatment. After this treatment, but before the coating, the substrate is superficially converted into a surface layer of gallium and arsenic nitrides in a third plasma containing nitrogen. In this way, an almost ideal passivation of the surface of a gallium and arsenic containing substrate can be obtained.

REFERENCES:
patent: 4361461 (1982-11-01), Chang
patent: 4436770 (1984-03-01), Nishizawa
patent: 4455351 (1984-06-01), Camlibel
Bayraktaroglu et al, "Silicon-Nitride-Gallium Arsenide MIS Structures Produced by Plasma Enhanced Deposition", J. Appl. Phys. 52(5), May 1981.
Clark et al "Improvements in GaAs/Plasma-Deposited Silicon Nitride . . . " J. Vac. Sci. Technol. 21(2), Jul./Aug. 1982, pp. 453-457.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-108624

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.