Method of manufacturing a semiconductor device

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

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C438S437000, C438S787000, C257SE21271, C257SE21546

Reexamination Certificate

active

07416955

ABSTRACT:
A method of manufacturing a semiconductor device, includes forming a first insulating film containing silicon oxide as a main ingredient, on an underlying region, adhering water to the first insulating film, forming a polymer solution layer containing a silicon-containing polymer on the water-adhered first insulating film, and forming a second insulating film containing silicon oxide as a main ingredient from the polymer solution layer, wherein forming the second insulating film includes forming silicon oxide by a reaction between the polymer and water adhered to the first insulating film.

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patent: 6191002 (2001-02-01), Koyanagi
patent: 7052971 (2006-05-01), Nishiyama et al.
patent: 7060559 (2006-06-01), Ozawa et al.
patent: 7238587 (2007-07-01), Hoshi et al.
patent: 7270886 (2007-09-01), Lee et al.
patent: 2004/0072429 (2004-04-01), Hieda et al.
patent: 2005/0263827 (2005-12-01), Shiba et al.
patent: 2003-258082 (2003-09-01), None

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