Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2005-03-08
2005-03-08
Whitmore, Stacy A. (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
C716S030000
Reexamination Certificate
active
06864105
ABSTRACT:
A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements.
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Eldridge Benjamin N.
Grube Gary W.
Khandros Igor Y.
Lotfizadeh Poya
Mathieu Gaetan L.
Burraston N. Kenneth
FormFactor Inc.
Whitmore Stacy A.
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