Method of manufacturing a p-type compound semiconductor thin fil

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437 95, 437108, 437111, 437112, 437945, 437946, 148DIG57, 148DIG110, 156610, H01L 2120

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051680777

ABSTRACT:
A p-type GaAs or AlGaAs thin film is formed by a MOCVD method. In the growing step of the thin film, the thin film is doped with a high concentration of carbon atoms forming an acceptor level such that the carrier concentration of the thin film falls within the range of between 1.times.10.sup.18 cm.sup.-3 and 1.times.10.sup.20 cm.sup.-3. At least one of trimethyl gallium and trimethyl aluminum is used as a raw material gaseous compound of III-group element, and arsine is used as a raw material gaseous compound of V-group element. The thin film is formed by an epitaxial growth under the molar ratio V/III of the V-group element supply rate to the III-group element supply rate, which is set at such a small value as 0.3 to 2.5, the temperature of 450 to 700.degree. and the pressure of 1 to 400 Torr. The thin film formed under these conditions exhibits a mirror-like smooth surface, and the film-growth rate is dependent on the supply rate of the V-group element.

REFERENCES:
patent: 4220488 (1980-09-01), Duchemin et al.
patent: 4370510 (1983-01-01), Stim
patent: 4588451 (1986-05-01), Vernon
patent: 4632710 (1986-12-01), Van Rees
patent: 4766092 (1988-08-01), Kuroda et al.
patent: 4826784 (1989-05-01), Salerno et al.
patent: 4908074 (1990-03-01), Hosoi et al.
patent: 4935381 (1990-06-01), Speckman et al.
Journal of Crystal Growth, vol. 57, 1982, pp. 605-605, North-Holland, Amsterdam, NL; A. Escobosa et al.: "Low temperature growth of MOCVD GaAs layers at atmospheric pressure" p. 605, col. 1, line 16-column 2, line 17; figure 2*.
Applied Physics Letters, vol. 50, No. 19, May 11, 1987, pp. 1386-1387, American Institute of Physics, New York, NY, US; D. W. Vook et al.: "Growth of GaAs by metalorganic chemical vapor deposition using thermally decomposed trimethylarsenic" *p. 1386, col. 1, line 34 col. 2, line 24; figure 2*.
Japanese Journal of Applied Physics, vol. 21, No. 11, Nov. 1982, p. L705-L706, Tokyo, JP; N. Kobayashi et al.: "Comparison between atmospheric and reduced pressure GaAs MOCVD".
Journal of Applied Physics, vol. 58, No. 8, pp. R31-R55, Oct. 1985, American Institute of Physics, Woodubry, NY, US; M. J. Ludowise: "Metalorganic Chemical Vapor Deposition of III-V Semiconductors" *pp. R36-R43: GaAs and Al.sub.x Ga.sub.1-x As*.
Applied Physics Letters, vol. 53, No. 18, Oct. 31, 1988, pp. 1726-1728, American Institute of Physics, New York, US; H. Nakagome et al.: "Extremely sharp erbium-related intra-4f-shell photoluminescene of ernium-doped GaAs grown by metalorganic chemical vapor deposition".
Journal of Applied Physics, vol. 64, No. 8, Oct. 15, 1988, pp. 3975, American Institute of Physics, Woodbury, NY, US; K. Saito et al.: "Characterization of p-type GaAs hevily doped with carbon grown by metalorganic molecular-beam epitaxy".
Appl. Phys. Lett. 54(1), pp. 39-41, Jan. 2, 1989, Makimoto et al.: "AlGaAs/GaAs heterojunction bipolar transistors with heavily C-doped base layers grown by flow-rate modulation . . .".
Japanese Journal of Applied Physics, vol. 24, No. 9, Sept., 1985 pp. 1189-1192 Tokumitsu et al: "Metalorganic molecular-beam epitaxial growth and characterization of GaAs using trimethyl-and triethyl-. . . ".
APPL. PHYS. LETT. 52 (7), pp. 522-524; Feb. 15, 1988, Guido et al: "Carbon-doped Al.sub.x GA.sub.1-x As-GaAs quantum well lasers".
IEEE ELECTRON DEVICE LETTERS, vol. 9, No. 9, Sep. 1988, Bhat et al: "Atomic layer epitaxy grown heterojunction bipolar transistor having a carbon-doped base".
APPL. PHYS. LETT. 53 (14), pp. 1317-1319, Oct. 3, 1988, Kuech et al: "Controlled carbon doping of GaAs by metalorganic vapor phase epitaxy."

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