Method of manufacturing a multilayer semiconductor device

Metal treatment – Compositions – Heat treating

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29571, 29576B, 29577C, 29576T, 148175, 148187, 357 231, 357 91, H01L 21265, C30B 3300

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045966044

ABSTRACT:
A method of obtaining a multilayer semiconductor device by forming a semiconductor crystallized layer through an insulative material over a semiconductor substrate in which a semiconductor device is formed. The insulative material is formed on the semiconductor substrate in which the semiconductor device is fabricated and a first semiconductor layer is formed on the insulative material. Thereafter, the surface of the first semiconductor layer is planarized and an insulative material is formed on this planarized surface, then a second semiconductor layer is formed on this insulative material. Next, the second semiconductor layer is crystallized by the irradiation of an energy beam, thereby fabricating a device in the second crystallized semiconductor layer.

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patent: 4523962 (1985-06-01), Nishimura
"Multilayer CMOS Device Fabricated on Laser Recrystallized Silicon Islands," Akiyama et al., International Electron Devices Meeting, Wash., 1983, p. 352.
"Transient Heating with Graphic Heaters for Semiconductor Processing", Fan et al., Laser and Electron-Beam Interactions with Solids, (1982).
"3-Dimensional SOI/CMOS IC's Fabricated by Beam Recrystallization," Kawamura et al., IEDM 1983.

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