Method of manufacturing a glass substrate and a magnetic...

Glass manufacturing – Processes – With wearing away of surface material

Reexamination Certificate

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C065S102000

Reexamination Certificate

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06877343

ABSTRACT:
In a magnetic recording medium, surface roughness of a glass substrate and the variation of the surface roughness are suppressed to the predetermined range. Namely, the surface roughness (Rmax, Ra, Rq) and the relation (Rmax/Ra) between Rmax and Ra are restricted to the predetermined range. In this event, Ra is representative of a center-line mean roughness, Rmax is defined as a maximum height representative of a difference between a highest point and a lowest point and Rq is representative of a root mean square roughness. Thereby, crystal grains of an underlying layer and a magnetic layer formed thereon are equalized. Specifically, the surface roughness is specified by Rmax≦15 nm, Ra≦1 nm and Rq≦1.5 nm. Further, the ratio between the surface roughness Rmax and the surface roughness Ra is specified by Rmax/Ra≦30.

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Shaun E. McKinlay et al.; “Microstructure/Magnetic Property Relationship In CoCrPt Magnetic Thin Films”; 1996 IEEE; pp. 3587-3589.

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