Method of manufacturing a bonding pad structure

Fishing – trapping – and vermin destroying

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437195, 437205, 437215, 437 8, 257723, 257786, H01L 2144

Patent

active

054361974

ABSTRACT:
A test card (10) or a semiconductor die (150) having bonding pads (41-43, 180-182) for testing semiconductor devices, and a method for making the bonding pads (41-43, 180-182) are shown. The test card (10) or the semiconductor die (150) is partitioned into a plurality of bonding pad regions (14-17 and 170-173). Bonding pads (41-43, 180-182) are formed in the respective bonding pad regions (14-17 and 170-173). The bonding pad regions (14-17 and 170-173) and the bonding pads (41-43, 180-182) are formed by patterning a layer of conductive material (16, 167) on a major surface (12) of the test card (10) or on the semiconductor die (150).

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