Method of managing mapping data indicative of excellent/defectiv

Details Method of managing mapping data indicative of excellent/defectiv Method of managing mapping data indicative of excellent/defectiv

1995-07-21

1998-01-06

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3102

Patent

active

057059357

ABSTRACT:
A mapping data indicative of locations of excellent integrated circuits is printed on a label sheet, and the label sheet carrying the mapping data is bonded to a peripheral area of a semiconductor wafer so as to easily manage the mapping data.

REFERENCES:
patent: 3847284 (1974-11-01), Wiesler et al.
patent: 4928002 (1990-05-01), Corley et al.

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