Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2006-04-04
2006-04-04
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C438S308000
Reexamination Certificate
active
07022532
ABSTRACT:
Spin-based microelectronic devices can be realized by utilizing ferromagnetic structures that make good ohmic contact with silicon, in order to avoid the Schottky barrier problem plaguing existing approaches to spin-based microelectronics, while allowing the devices to be based on silicon substrates, which are well-known and used in the industry. Thin layers of metal silicide, such as CoSi2and NiSi2, are used as an intermediate layer between ferromagnetic contacts, such as cobalt and nickel contacts, and the silicon substrate. The thin silicide layers provide good ohmic contact between the ferromagnetic contacts and silicon, such that spin-polarized carriers can be injected into the silicon, and detected out of the silicon, without loss of spin polarization.
REFERENCES:
patent: 6753562 (2004-06-01), Hsu et al.
Hopper Peter J.
Mian Michael
Vashchenko Vladislav
National Semiconductor Corporation
Pert Evan
Stallman & Pollock LLP
LandOfFree
Method of making spin-injection devices on silicon material... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of making spin-injection devices on silicon material..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making spin-injection devices on silicon material... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3619036