Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal
Patent
1978-04-13
1979-03-06
Dean, R.
Metal treatment
Process of modifying or maintaining internal physical...
Chemical-heat removing or burning of metal
29571, 29572, 148 15, 156657, 156659, 156662, 250332, 250370, 357 24, 357 30, 357 45, 357 49, 357 56, H01L 2120, H01L 2714
Patent
active
041429257
ABSTRACT:
A layer of epitaxial silicon is grown on a silicon growth substrate, a thin layer of silicon dioxide or other suitable insulator is grown (in the case of silicon dioxide) or deposited (for other insulators) on the epitaxial layer, and a thick layer of polysilicon is grown on the dioxide layer. The silicon growth substrate is then removed, and the epitaxial layer is etched to form islands on the insulator layer. Some of the islands are doped to form an array of infrared sensitive detectors, and a large island is doped to act as CCD region. Electrical leads are fabricated, some to provide drive and output lines for the CCDs, other to provide connections of the detectors to respective CCDs, and yet others to provide common leads for the detectors.
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Steckl et al., "Theoretical Analysis . . . IRCCD Serial Scanning," Appl. f. on Charge Coupled Dev., Proceedings, San Diego, Ca., 1973, pp. 247-258.
King Gerard J.
Martino, Jr. Joseph F.
Dean R.
Dunn Aubrey J.
Edelberg Nathan
Lee Milton W.
Saba W. G.
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