Method of making semiconductor MOSFET device by bombarding with

Metal treatment – Compositions – Heat treating

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29576B, 29571, 148187, 357 91, H01L 21263, H01L 2126

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active

044695276

ABSTRACT:
A semiconductor substrate is formed by irradiating a semiconductor substrate with radioactive ray so as to generate lattice defects therein for making the entire substrate semi-insulating and then rendering only the surface of the thus irradiated substrate semiconductive, so that a semiconductor device is produced by using the substrate thus formed.

REFERENCES:
patent: 3733222 (1973-05-01), Schiller
patent: 3967982 (1976-07-01), Arndt et al.
patent: 4025365 (1977-05-01), Martin et al.
patent: 4147564 (1979-04-01), Magee et al.
patent: 4187126 (1980-02-01), Radd et al.
patent: 4278475 (1981-07-01), Bartko et al.
Prussin et al., J. Electrochem. Soc., 125, (1978), 350.
Hodgson, IBM-TDB, 23, (1980), 373.
Petersen, IBM-TDB, 22, (1979), 2080.
Tsu et al., Phys. Rev. Letts., 42, (1979), 1356.
Mirianashvili et al., Sov. Phys.-Semiconductors, 4, (1971), 1612-15.
Kuchar et al., Phys. Stat. Solidi, 24a, (1974), 513.
Maenpaa et al., Thin Solid Films, 67, (1980), 293.
Fowler et al., IBM-TDB, 24, (1981), 1090.

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