Semiconductor device manufacturing: process – Semiconductor substrate dicing – With attachment to temporary support or carrier
Reexamination Certificate
2011-06-07
2011-06-07
Le, Dung A. (Department: 2818)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
With attachment to temporary support or carrier
C438S108000, C438S109000, C438S612000, C438S613000
Reexamination Certificate
active
07955954
ABSTRACT:
A semiconductor device and method. One embodiment provides an integral array of first carriers and an integral array of second carries connected to the integral array of first carriers. First semiconductor chips are arranged on the integral array of first carriers. The integral array of second carriers is arranged over the first semiconductor chips.
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The First Office Action for Chinese Patent Application No. 200910134172.7 issued Apr. 23, 2010 (9 pages).
Landau Stefan
Mahler Joachim
Wowra Thomas
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Le Dung A.
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