Method of making semiconductor device structures by means of ion

Metal treatment – Compositions – Heat treating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

148187, 357 91, H01L 21263, H01L 21265

Patent

active

043869688

ABSTRACT:
Disclosed is a simplified method of producing semiconductor device structures in an integrated technology using at least one ion implantation step. Implantation of the doping ions into a silicon wafer, for example, for producing a subcollector or an emitter, is not effected, as previously, in an ultra-high vacuum atmosphere through a thin protective layer of silicon dioxide which is applied by a separate thermal oxidation step prior to implantation, but the doping ions are directly implanted into the bare silicon wafer. The latter implantation is effected in an atmosphere of increased partial pressure of oxygen. Enhanced diffusion of the oxygen adsorbed at the surface occurs into the vacancies which are generated by the implanted doping ions close the surface of the silicon wafer. In this manner a silicon dioxide protective layer is formed already in the initial stage of ion implantation. As a result one process step can be saved, namely, the production of the protective layer by thermal oxidation prior to ion implantation.

REFERENCES:
patent: 3563809 (1971-02-01), Wilson
patent: 4018627 (1977-04-01), Polata
patent: 4144100 (1979-03-01), MacIver et al.
patent: 4170492 (1979-10-01), Bartlett et al.
patent: 4179792 (1979-12-01), Marshall et al.
"Ionenimplantation" by Ryssel and Ruge, p. 29, B. G. Teubner, Stuttgart, 1978.
Seidel et al., IEEE-Trans. Electron Devices, ED-24 (June 1977), 717.
Masetti et al., Solid St. Electronics, 16 (1973), 1419.
Briska et al., IBM-TDB, 23 (1980) 644.
Beyer et al., IBM-TDB, 20 (1978), 3122.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making semiconductor device structures by means of ion does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making semiconductor device structures by means of ion, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making semiconductor device structures by means of ion will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2341986

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.