Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2008-06-13
2011-10-04
Le, Dung A. (Department: 2818)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S706000, C438S710000, C438S508000
Reexamination Certificate
active
08030216
ABSTRACT:
A plasma processing method, which enables the etching controllability for a high-dielectric-constant insulating film to be improved. A substrate having a high-dielectric-constant gate insulating film and a hard mask formed thereon is subjected to etching processing using a plasma of a processing gas containing a noble gas and a reducing gas.
REFERENCES:
patent: 2002/0011463 (2002-01-01), Buskirk et al.
patent: 2004/0007561 (2004-01-01), Nallan et al.
patent: 2007/0077767 (2007-04-01), Jin et al.
patent: 2005-39015 (2005-02-01), None
Kozuka Shinichi
Umehara Naoto
Le Dung A.
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Tokyo Electron Limited
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