Method of making self-aligned dual stripe magnetoresistive (DRMR

Semiconductor device manufacturing: process – Having magnetic or ferroelectric component

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438104, H01L 2100

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active

057834601

ABSTRACT:
A method for forming a dual stripe magnetoresistive (DSMR) sensor element. The method employs a lift off stencil an etch mask for sequentially anisotropically etching a blanket second magnetoresistive (MR) layer, a blanket inter stripe dielectric layer and a blanket first magnetoresistive (MR) layer to form a patterned second magnetoresistive (MR) layer, a patterned inter stripe dielectric layer and a patterned first magnetoresistive (MR) layer with fully aligned edges. The lift off stencil is then employed as a lift off mask in forming a patterned dielectric layer covering the fully aligned edges. In a second embodiment a window within a lift off stencil is employed as an etch mask in forming aligned edges of a trimmed patterned first magnetoresistive (MR) layer and a trimmed patterned second magnetoresistive (MR) layer within the composite track width of a patterned first magnetoresistive (MR) layer and a patterned second magnetoresistive (MR) layer which are offset.

REFERENCES:
patent: 5424236 (1995-06-01), Daughton et al.
patent: 5573809 (1996-11-01), Nix et al.
patent: 5646051 (1997-07-01), Solin

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