Method of making Schottky barrier diode by ion implantation and

Metal treatment – Compositions – Heat treating

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148187, 357 15, 357 91, H01L 2990, B01J 700, B01J 1700

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042604311

ABSTRACT:
A Schottky barrier diode is formed in a low impurity concentration N-type substrate by ion implanting N-type impurities to form a deep region having increased impurity surface concentration of at least 10.sup.16 carriers per cubic centimeters, forming P-type guard ring in the deep N-type region and forming an N.sup.+ contact region in the deep N-type region. NPN transistors can be fabricated in the original low impurity substrate or in an ion implanted substrate region having a lower breakdown voltage. Schottky clamped NPN transistors formed in the low impurity substrate include ion implanted regions interior to a base ring and extending down into a buried N.sup.+ collector region as does an ion implanted surface collector contact region having an N.sup.+ contact area.

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Calhoun et al., IBM-Tech. Discl. Bull. 18 (1975) 1847.
Knepper, R. W., IBM-Tech. Discl. Bull. 17 (1974) 1609.

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