Semiconductor device manufacturing: process – Making passive device – Trench capacitor
Reexamination Certificate
2011-04-05
2011-04-05
Sarkar, Asok K (Department: 2891)
Semiconductor device manufacturing: process
Making passive device
Trench capacitor
C438S243000, C257S301000, C257SE27048, C257SE27092
Reexamination Certificate
active
07919384
ABSTRACT:
A method of making planar-type bottom electrode for semiconductor device is disclosed. A sacrificial layer structure is formed on a substrate. Multiple first trenches are defined in the sacrificial layer structure, wherein those first trenches are arranged in a first direction. The first trenches are filled with insulating material to form an insulating layer in each first trench. Multiple second trenches are defined in the sacrificial layer structure between the insulating layers, and are arranged in a second direction such that the second trenches intersect the first trenches. The second trenches are filled with bottom electrode material to form a bottom electrode layer in each second trench. The insulating layers separate respectively the bottom electrode layers apart from each other. Lastly, removing the sacrificial layer structure defines a receiving space by two adjacent insulating layers and two adjacent bottom electrode layers.
REFERENCES:
patent: 6914286 (2005-07-01), Park
Li Ming-Yen
Tsai Wen-Li
Wu Hsiao-Che
Muncy Geissler Olds & Lowe, PLLC
ProMOS Technologies Inc.
Sarkar Asok K
Slutsker Julia
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