Method of making multiple lead voltage probe

Details Method of making multiple lead voltage probe Method of making multiple lead voltage probe

1997-04-30

1999-08-24

Arbes, Carl J.

Metal working

Method of mechanical manufacture

Electrical device making

29593, 324754, H01R 900

Patent

active

059409657

ABSTRACT:
A probe head includes analog amplifier inputs, a ground plane, and hundreds of probe leads between the inputs and the pins of a circuit under test. The customer defines the grounded pins of the circuit under test. Non-active probe leads, i.e. leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials. The probe circuit is on a probe circuit board, while the connections between the ground plane and the leads are fusible elements on a separate ground personality board. The probe is placed on a simulated circuit under test, the grounded pins on the circuit under test are protected by an insulating cap, and a voltage is placed on the remainder of the pins to fuse the elements corresponding the active probe leads.

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