Fishing – trapping – and vermin destroying
Patent
1984-11-30
1987-09-22
Hearn, Brian E.
Fishing, trapping, and vermin destroying
148DIG109, 437 59, 437 60, 437225, H01L 2172, H01L 21385
Patent
active
046945610
ABSTRACT:
A trench version of a high-capacitance (Hi-C) capacitor for a dynamic random-access-memory (DRAM) cell is made utilizing a modified version of the doping technique described in U.S. Pat. No. 4,471,524 and 4,472,212. A shallow highly doped trench region is thereby formed. At the same time, selected lateral surface portions of the structure are also thereby highly doped. These surface portions permit a direct electrical connection to be easily made between the capacitor and a subsequently formed adjacent access transistor.
REFERENCES:
patent: 3387286 (1968-06-01), Dennard
patent: 3928095 (1975-12-01), Harigaya et al.
patent: 3969746 (1976-07-01), Kendall et al.
patent: 4063967 (1977-12-01), Graul et al.
patent: 4219368 (1980-08-01), David
patent: 4274892 (1981-06-01), Templin
patent: 4471524 (1984-09-01), Kinsbron et al.
patent: 4472212 (1984-09-01), Kinsbron
patent: 4523369 (1985-06-01), Nogakubo
Minegishi et al, "A Submicron CMOS Megabit Level Dynamic RAM Technology Using Doped Face Trench Capacitor Cell", IEDM Tech. DIG. pp. 319-322, 1983.
Morie et al, "Depletion Trench Capacitor Cell", Extended Abstracts of the 15th Conference on Solid State Devices and Materials, Tokyo, 1983, pp. 253-256.
Ghandi, VLST Fabrication Principles, John Wiley & Sons, New York, 1983, p. 323.
Nakajima et al, "A Submicrometer Megabit DRAM Process Technology Using Trench Capacitors", IEEE Transactions on Electron Devices, vol. ED-32, 2, 2/85.
"The Hi-C RAM Cell Concept", A. F. Tasch, IEEE Transactions on Electron Devices, vol. ED-25, No. 1, Jan. 1978, pp. 33-41.
"Depletion Trench Capacitor Technology for Megabit Level MOS DRAM", T. Morie et al, IEEE Electron Device Letters, vol. EDL-4, No. 11, Nov. 1983, pp. 411-414.
Lebowitz Joseph
Lynch William T.
American Telephone and Telegraph Company AT&T Bell Laboratories
Canepa Lucian C.
Hearn Brian E.
Thomas Tom
LandOfFree
Method of making high-performance trench capacitors for DRAM cel does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of making high-performance trench capacitors for DRAM cel, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making high-performance trench capacitors for DRAM cel will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2050916