Method of making FETs in GaAs by dual species implantation of si

Metal treatment – Compositions – Heat treating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29571, 29576B, 148187, 148DIG84, 357 91, H01L 21265, H01L 2120

Patent

active

046029656

ABSTRACT:
A method of preparing an active surface layer on a semi-insulating GaAs substrate comprising the steps of ion implanting a surface layer with silicon to form an n-type active layer and ion implanting a buried diffusion layer beneath the active layer with boron to prevent defects in the substrate from influencing the active region. The method is particularly useful for GaAs MESFETs.

REFERENCES:
patent: 4108686 (1978-08-01), Jacobus
patent: 4149915 (1979-04-01), Bohg
patent: 4154626 (1979-05-01), Joy
patent: 4185291 (1980-01-01), Hirao
patent: 4190850 (1980-02-01), Tihanyi
patent: 4193182 (1980-03-01), Lee
patent: 4217149 (1980-08-01), Sawazaki
patent: 4350991 (1982-09-01), Johnson
patent: 4377030 (1983-03-01), Pettenpaul et al.
patent: 4391651 (1983-07-01), Yoder
patent: 4469528 (1984-09-01), Berth et al.
patent: 4489480 (1984-12-01), Martin et al.
patent: 4494995 (1985-01-01), Alavi et al.
patent: 4505023 (1985-03-01), Tseng et al.
patent: 4519127 (1985-05-01), Arai
Stoneham et al., Jour. Electronic Mat. 9 (1980) 371.
Rao et al. in Ion Implantation in Semiconductors, ed. Chernow et al., Plenum, N.Y., 1977, p. 77.
Martin et al., Jour. Appl. Phys. 53 (1982) 8706.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making FETs in GaAs by dual species implantation of si does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making FETs in GaAs by dual species implantation of si, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making FETs in GaAs by dual species implantation of si will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-698792

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.