Method of making contact with circuit units to be tested in...

Details Method of making contact with circuit units to be tested in... Method of making contact with circuit units to be tested in...

2006-07-11

2006-07-11

Prasad, Chandrika (Department: 2839)

Electrical connectors

Including handle or distinct manipulating means

Randomly manipulated implement

C324S754090

Reexamination Certificate

active

07074072

ABSTRACT:
A contact-making apparatus for making contact with circuit units to be tested in a tester contains a printed circuit board device that has electrical connections to the tester, and a test module device. The test module device has first contact-making elements for making electrical contact between the test module device and the printed circuit board device, and second contact-making elements for making electrical contact between the test module device and the circuit unit to be tested. When the printed circuit board device and the circuit unit to be tested are pressed onto each other, a spring force of the first contact-making elements is lower than the spring force of the second contact-making elements under a low initial compression, and a spring force of the first contact-making elements are higher than the spring force of the second contact-making elements under a high final compression.

REFERENCES:
patent: 5772451 (1998-06-01), Dozier et al.
patent: 6791345 (2004-09-01), Maruyama et al.
patent: 2002/0048973 (2002-04-01), Zhou et al.
patent: 2003/0099097 (2003-05-01), Mok et al.
patent: 2003/0173661 (2003-09-01), Zhou et al.
patent: 101 51 125 (2002-06-01), None

Affiliated with

Also associated with

Rating

Method of making contact with circuit units to be tested in... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making contact with circuit units to be tested in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making contact with circuit units to be tested in... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3567629