X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
A zone plate multilayer structure includes a substrate carrying a plurality of alternating layers respectively formed of tungsten silicide (WSi2) and silicon (Si). The alternating layers are sequentially deposited precisely controlling a thickness of each layer from a minimum thickness of a first deposited layer adjacent the substrate to a maximum thickness of a last deposited layer. The first minimum thickness layer has a selected thickness of less than or equal to 5 nm with the thickness of the alternating layers monotonically increasing to provide a zone plate multilayer structure having a thickness of greater than 12 μm (microns). The x-rays are diffracted in Laue transmission geometry by the specific arrangement of silicon and tungsten silicide.
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Conley Raymond P.
Kang Hyon Chol
Liu Chian Q.
Macrander Albert T.
Kao Chih-Cheng G
UChicago Argonne LLC
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