Fishing – trapping – and vermin destroying
Patent
1989-08-24
1990-12-11
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
148DIG24, 148DIG97, 148DIG169, 156611, 437107, 437939, H01L 21203
Patent
active
049771035
ABSTRACT:
The presence of oval defects on MBE-grown compound semiconductor (e.g., GaAs, InP, or InGaAs) epitaxial layers has proven to be a serious obstacle to the use of such material for the manufacture of integrated circuits (ICs), even though the use of such material potentially could result in ICs having superior performance. One particularly prevalent type of oval defect is generally referred to as .alpha.-type. It has now been discovered that compound semiconductor epitaxial layers that are essentially free of .alpha.-type oval defects can be grown by MBE if first at least a portion of the Ga and/or In metal crucible is coated with an appropriate second metal. The second metal is chosen from the group of metals that are wetted by the first metal and that are less electronegative than the first metal. Aluminum is a currently preferred second metal. Advantageously the interior of the (typically pBN) crucible is Al-coated at least at and near the orifice of the crucible, whereby formation of drops of first metal is prevented.
REFERENCES:
patent: 3986822 (1976-10-01), Lashway
patent: 4181544 (1980-01-01), Cho
patent: 4426237 (1984-01-01), Freeouf et al.
patent: 4426237 (1984-01-01), Freeouf et al.
patent: 4732648 (1988-03-01), Fronius et al.
patent: 4773852 (1988-09-01), Tanji et al.
patent: 4913652 (1990-04-01), Tanji et al.
"Classification and Origins of GaAs Oval Defects Grown by Molecular Beam Epitaxy", by K. Fujiwara et al., Journal of Crystal Growth, .lambda.(1987), pp. 104-112.
"Reduction of Gallium-Related Oval Defects", by D. G. Schlom et al., Journal Vacuum Science Technology, B7 (2), Mar./Apr. 1989, pp. 296-298.
"GaAs Substrate Preparation for Oval-Defect Elimination During MBE Growth", by H. Fronius et al., Japanese Journal of Applied Physics, vol. 25, Feb. 1986, pp. L137-138.
"Origin of Oval Defects in GaAs Layers Grown by Molecular Beam Epitaxy", by K. Akimoto et al., Journal of Crystal Growth, 73 (1985), pp. 117-122.
"Summary Abstract: The MBE Growth of GaAs Free of Oval Defects", by G. D. Pettit et al., Journal Vacuum Science Technology, B2(2), Apr./Jun. 1984, pp. 241-242.
"Source and Elimination of Oval Defects on GaAs Film Grown by Molecular Beam Epitaxy", by Y. G. Chai et al., Applied Physics Letters, 38(10), May 15, 1981, pp. 796-798.
"Oval Defects in Ga.sub.1-x Al.sub.x As Molecular Beam Epitaxy Layers: A Raman Scattering and Photoluminescence Combined Study", By J. Sapriel et al., Applied Physics Letters, 52(23), Jun. 6, 1988, pp. 1970-1972.
"Characterization of Oval Defects in Molecular Beam Epitaxy Ga.sub.0.7 Al.sub.0.3 As Layers by Spatially Resolved Cathodoluminescence", by A. C. Papadopoulo et al., Applied Physics Letters, 52(3), Jan. 18, 1988, pp. 224-226.
"Influence of Surface Defects on the Characteristics of High Electron Mobility Transistors Grown by Molecular-Beam Epitaxy", by T. Nakamura et al., Journal Applied Physics, 64(4), Aug. 15 1988, pp. 2164-2167.
"On the Origin of Oval Defect with Nucleus on Epilayers Grown by Molecular Beam Epitaxy", by Y. Nishikawa et al., Japanese Journal of Applied Physics, vol. 25, No., 6, Jun. 1986, pp. 908-909.
"Ga.sub.2 O.sub.3 : The Origin of Growth-Induced Oval Defects in GaAs Molecular Beam Epitaxy", by S. Weng, Applied Physics Letters, 49(6), Aug. 11, 1986.
"Particulates: A Direct Origin of Oval Defects in GaAs Layers Grown by Molecular Beam Epitaxy", by S. Weng et al., Journal of Elecronic Materials, vol. 15, No. 5, 1986, pp. 267-271.
Parker, The Technology and Physics of Molecular Beam Epitaxy, Plenum Press, New York, 1985, pp. 24-28.
AT&T Bell Laboratories
Bunch William
Chaudhuri Olik
Pacher Eugen E.
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