Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Patent
1995-09-22
1999-03-02
Chaudhari, Chandra
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
438459, 438464, H01L 2166
Patent
active
058770348
ABSTRACT:
A method of making a three-dimensional integrated circuit by transferring fully processed devices from a device layer of first substrate to an auxiliary substrate, separating the auxiliary substrate and the devices thereon into individual chips, testing the chips for their functionality and mounting functioning chips on a carrier substrate in a side-by-side arrangement to form a device layer therein and thereafter mounting a further device layer on said device layer of said carrier substrate. Electrical inter-connection are formed between the devices of said to layers through passage ways in their respective substrates.
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Buchner Reinhold
Ramm Peter
Chaudhari Chandra
Fraunhofer Gesellschaft zur Foerderung der angwandten Forschung
Hormann Karl
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