Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Patent
1996-06-24
1997-08-12
Niebling, John
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
438107, 438459, 438977, H01L 21302, H01L 21463
Patent
active
056565526
ABSTRACT:
A method of making a multi-chip module by thinning individual integrated circuit die or an integrated circuit wafer containing multiple integrated circuits; bonding thinned dice or a thinned wafer to a mylar, polyimide, semiconductor, or ceramic substrate; depositing at least one interconnect material over the wafer, where the first interconnect layer is deposited directly over the wafer; depositing a dielectric layer over each of the interconnect layers; opening vias in the dielectric layers in order to interconnect the dice and multi-chip module as required; and removing the substrate to form a thin, conformal, and high-yielding multi-chip module.
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Hudak John James
Mountain David Jerome
Morelli Robert D.
Niebling John
Turner Kevin F.
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