Method of making a semiconductor device with surge current...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Making emissive array

Reexamination Certificate

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C438S029000, C438S031000, C438S035000, C438S039000, C438S042000, C438S045000, C438S046000, C438S571000, C438S572000, C257S409000, C257S452000, C257S484000, C257S594000, C257SE33054, C257SE31099

Reexamination Certificate

active

07960198

ABSTRACT:
A wide bandgap semiconductor device with surge current protection and a method of making the device are described. The device comprises a low doped n-type region formed by plasma etching through the first epitaxial layer grown on a heavily doped n-type substrate and a plurality of heavily doped p-type regions formed by plasma etching through the second epitaxial layer grown on the first epitaxial layer. Ohmic contacts are formed on p-type regions and on the backside of the n-type substrate. Schottky contacts are formed on the top surface of the n-type region. At normal operating conditions, the current in the device flows through the Schottky contacts. The device, however, is capable of withstanding extremely high current densities due to conductivity modulation caused by minority carrier injection from p-type regions.

REFERENCES:
patent: 4982260 (1991-01-01), Chang et al.
patent: 5449925 (1995-09-01), Baliga et al.
patent: 6104043 (2000-08-01), Hermansson et al.
patent: 6175143 (2001-01-01), Fujihira et al.
patent: 6524900 (2003-02-01), Dahlqvist et al.
patent: 6573128 (2003-06-01), Singh
patent: 6693308 (2004-02-01), Sankin et al.
patent: 6815304 (2004-11-01), Sankin et al.
patent: 6838710 (2005-01-01), Barkhordarian
patent: 6861723 (2005-03-01), Willmeroth
patent: 6897133 (2005-05-01), Collard
patent: 7095050 (2006-08-01), Wanlass et al.
patent: 7173311 (2007-02-01), Sato et al.
patent: 7242040 (2007-07-01), Sankin et al.
patent: 7274083 (2007-09-01), Sankin et al.
patent: 7416929 (2008-08-01), Mazzola et al.
patent: 7510921 (2009-03-01), Sankin et al.
patent: 7556994 (2009-07-01), Sankin et al.
patent: 7700960 (2010-04-01), Kim et al.
patent: 2001/0054715 (2001-12-01), Collard et al.
patent: 2003/0045035 (2003-03-01), Shenai et al.
patent: 2003/0162355 (2003-08-01), Sankin et al.
patent: 2004/0159865 (2004-08-01), Allen et al.
patent: 2006/0113561 (2006-06-01), Sankin et al.
patent: 2007/0122951 (2007-05-01), Sankin et al.
patent: 2007/0200115 (2007-08-01), Das et al.
patent: 2007/0262323 (2007-11-01), Sonobe et al.
patent: 2008/0003731 (2008-01-01), Mazzola et al.
patent: 2008/0042203 (2008-02-01), Hovel et al.
patent: 2008/0093637 (2008-04-01), Sankin et al.
patent: 2008/0251796 (2008-10-01), Lee et al.
Neudeck et al. (Measurements of Breakdown Field and Forward Current Stability in 3C-SiC pn junction diodes grown on step-free 4H-SiC, Silicon Carbide and Related Materials, 2005).
B.J. Baliga, “Analysis of a high-voltage merged p-i-n/Schottky (MPS) rectifier,” IEEE Electron Device Letters, vol. 8, Issue 9, Sep. 1987 pp. 407-409.
W.V. Muench and I. Plaffeneder: “Breakdown field in vapor-grown silicon carbide p-n junctions,” Journal of Applied Physics, vol. 48, No. 11, Nov. 1977.
V.E. Chelnokov, A.M. Strel'chuk, P.A. Ivanov; G. Lentz, C. Parniere: “Silicon carbide p-n structures as power rectifiers,” Proceedings of the 6th International Symposium on Power Semiconductor Devices and ICs, 1994. ISPSD '94, pp. 253-256.
K.V. Vasilevskki, K. Zekentes, A.V. Zorenko, and L.P. Romanov: “Experimental Determination of Electron Drift Velocity in 4H-SiC p+-n-n+ Avalanche Diodes,” IEEE Electron Device Letters, vol. 21, No. 10, Oct. 2000 pp. 485-487.
L. Yuan, J.A. Cooper, Jr., M.R. Melloch, and K.J. Webb: “Experimental Demonstration of a Silicon Carbide IMPATT Oscillator,” IEEE Electron Device Letters, vol. 22, No. 6, Jun. 2001, pp. 266-268.
D.T. Morisette and J.A. Cooper, Jr: “Theoretical Comparison of SiC PiN and Schottky Diodes Based on Power Dissipation Considerations,” IEEE Transactions on Electron Devices, vol. 49, No. 9, Sep. 2002, pp. 1657-1664.
I. Sankin, J.B. Casady, “Power SiC MOSFETs,” book chapter: Advances in Silicon Carbide Processing and Applications, S. E. Saddow and A. Agrawal, Editors.
H. Saitoh, T. Kimoto, and H. Matsunami: “Origin of Leakage current in SiC Schottky Barrier Diodes at High Temperature,” Material Science Forum vols. 457-460 (2004) pp. 997-1000.
A.O. Konstantinov, Q. Wahab, N. Nordell, U. Lindefelt: “Ionization rates and critical fields in 4H silicon carbide,” Appl. Phys. Lett., vol. 71, No. 1, Jul. 7, 1997, pp. 90-92.

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