Method of making a probe tip

Metal working – Method of mechanical manufacture – Electrical device making

Reexamination Certificate

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Details

C029S832000, C029S831000, C029S837000, C029S854000, C029S857000

Reexamination Certificate

active

07975363

ABSTRACT:
A probe includes a substrate and a tetragonal structure disposed on the substrate that has four end points. Three of the end points are disposed adjacent to the substrate. A fourth of the end points extends outwardly and substantially normal to the substrate. In a method of making a probe tip, a plurality of tetrapods are grown and at least one of the tetrapods is placed on a substrate at a selected location. The tetrapod is affixed to the substrate at the selected location.

REFERENCES:
patent: 5357109 (1994-10-01), Kusumoto
patent: 5357787 (1994-10-01), Kado et al.
patent: 6855202 (2005-02-01), Alivisatos et al.
patent: 7097385 (2006-08-01), Tabler

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