Fishing – trapping – and vermin destroying
Patent
1995-05-22
1996-11-26
Bowers, Jr., Charles L.
Fishing, trapping, and vermin destroying
437 41, 437 44, 437 40, H01L 21266, H01L 21335
Patent
active
055785093
ABSTRACT:
A method for producing a field effect transistor including source and drain regions produced by implanting a dopant impurity employing a gate electrode as a mask includes producing a gate electrode at a region on a first conductivity type semiconductor substrate; implanting a dopant impurity producing a second conductivity type in the substrate employing the gate electrode as a mask, thereby producing source and drain regions having a first dopant impurity concentration; producing a photoresist pattern on the substrate covering a drain electrode side of the substrate and having an aperture at a source electrode side of the substrate on the opposite side of the gate electrode from the drain electrode side and implanting a dopant impurity producing the second conductivity type in the substrate employing the photoresist pattern as a mask, thereby converting the source region from a first dopant impurity concentration to a second, high dopant impurity concentration; and diagonally rotatingly implanting in the substrate a dopant impurity producing the first conductivity type employing the photoresist pattern as a mask, thereby producing a first conductivity type region with a higher dopant impurity concentration than the substrate that surrounds the source region.
REFERENCES:
patent: H986 (1991-11-01), Codella et al.
patent: 4173818 (1979-11-01), Bassous et al.
patent: 4442589 (1984-04-01), Doo et al.
patent: 4929991 (1990-05-01), Blanchard
patent: 4956308 (1990-09-01), Griffin et al.
patent: 5153683 (1992-10-01), Noda
patent: 5155563 (1992-10-01), Davies et al.
patent: 5210044 (1993-05-01), Yoshikawa
patent: 5216272 (1993-06-01), Kubokoya et al.
patent: 5304827 (1994-04-01), Malhi et al.
patent: 5306656 (1994-04-01), Williams et al.
patent: 5364807 (1994-11-01), Hwang
patent: 5371394 (1994-12-01), Ma et al.
patent: 5376566 (1994-12-01), Gonzalez
patent: 5384479 (1995-01-01), Taniguchi
T. N. Buti, et al., IEEE Trans. Electron Dev., 38(8)(1991) 1757 "Assymetrical Halo Source Gold Drain . . . n-MOSFET . . . ".
E. Bassous, et al., IBM Tech. Discl. Bulletin, 21(12)(1979) 5035 " . . . IGFET Structures with . . . Submicron Channel Lengths".
S. N. Chakravarti, et al., IBM Tech. Discl. Bulletin, 19(4)(1976) 1162 "Double Diffused MOS FET".
Bowers Jr. Charles L.
Mitsubishi Denki & Kabushiki Kaisha
Radomsky Leon
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