Method of making a device for measuring deformation

Details Method of making a device for measuring deformation Method of making a device for measuring deformation

2008-04-24

2009-10-27

Trinh, Minh (Department: 3729)

Metal working

Method of mechanical manufacture

Electrical device making

C029S593000, C029S595000, C029S025350, C438S050000, C438S960000

Reexamination Certificate

active

07607213

ABSTRACT:
A method of making a device for measuring deformation includes a step of depositing a silicon adhesion underlayer on a silicon carbide surface by chemical vapor spraying, and a step of depositing a coating on the silicon adhesion underlayer by atmospheric thermal spraying.

REFERENCES:
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patent: 5867886 (1999-02-01), Ratell et al.
patent: 6299988 (2001-10-01), Wang et al.
patent: 7442444 (2008-10-01), Hazel et al.
patent: 893571 (1962-04-01), None
patent: 9-159170 (1997-06-01), None
U.S. Appl. No. 12/108,867, filed Apr. 24, 2008, Leman et al.

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