Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – Including change in a growth-influencing parameter
Patent
1994-05-11
1995-12-05
Breneman, R. Bruce
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
Including change in a growth-influencing parameter
117108, 437105, 437107, H01L 2120
Patent
active
054719488
ABSTRACT:
A doped or undoped photoresponsive material having metallic precipitates, and a PiN photodiode utilizing the material for detecting light having a wavelength of 1.3 micrometers. The PiN photodiode includes a substrate having a first compound semiconductor layer disposed thereon. The PiN photodiode further includes an optically responsive compound semiconductor layer disposed above the first compound semiconductor layer. The optically responsive layer includes a plurality of buried Schottky barriers, each of which is associated with an inclusion within a crystal lattice of a Group III-V material. The PiN device also includes a further compound semiconductor layer disposed above the optically responsive layer. For a transversely illuminated embodiment, waveguiding layers may also be disposed above and below the PiN structure. In one example the optically responsive layer is comprised of GaAs:As. The GaAs:As exhibits a very low room temperature dark current, even under forward bias conditions, and a responsivity to 1.3 micrometer radiation modulated at frequencies greater than 1 GHz.
REFERENCES:
patent: 4439910 (1984-04-01), Vasudev
patent: 4794438 (1988-12-01), Levinson et al.
patent: 4801994 (1989-01-01), Van Gorkom et al.
patent: 4816183 (1989-03-01), Bates, Jr.
patent: 4952527 (1990-08-01), Calawa et al.
patent: 5168069 (1992-12-01), Smith et al.
Melloch et al., "Formation of arsenic precipitates in GaAs buffer layers grown by molecular beam epitaxy at low substrate temperatures," Appl. Phys. Lett. 57 (15), 8 Oct. 1990, pp. 1531-1533.
Melloch et al. "GaAs buffer layers grown at low substrate temperatures using As.sub.2 and the formation of arsenic precipitates," Journal of Crystal Growth 111, May 1991, pp. 39-42.
"Characterization of an Optoelectronic Terahertz Beam System", IEEE Transactions on Microwave Theory and Techniques, vol. 38, No. 11, Nov. 1990, pp. 1684-1691, by van Exter et al.
"New MBE Buffer Used to Eliminate Backgating in GaAs MESFET's", By F. W. Smith et al. IEEE Electron Device Lett. vol. 9, No. 2, Feb. 1988, p. 2375.
"Infrared Response from Metallic Particles Embedded in a Single-Crystal Si Matrix: The Layered Internal Photoemission Sensor" by R. Fathauer et al. Appl. Phys. Lett. 57(14) 1 Oct. 1990, pp. 1419-1421.
"Optically Induced Reordering of As Cluster Defects in Semiinsulating GaAs" by J. Jimenez et al., Cryst. Latt. Def. and Amorph. Mat., 1987, vol. 17, pp. 199-204.
"Effect of GaAs Buffer Layer Grown at Low Substrate Temperatures on a High-Electron-Mobility Modulation-Doped-Two-Dimensional Electron Gas" by R. Melloch et al., App. Phys. Lett. 54(10) 6 Mar. 1989, pp. 943-945.
"Structural Properties of As-Rich GaAs Grown by Molecular Beam Epitaxy at Low Temperatures" by M. Kaminska et al., Appl. Phys. Lett. 54(19) 8 May 1989, pp. 1881-1883.
"Bistability and Metastability of the Gallium Vacancy in GaAs: The Actuator of E12?" by G. Baraff et al., Physical Review Letters, vol. 55, No. 21, 18 Nov. 1985, pp. 2340-2343.
"GaAs Field-Effect Transistor Properties, As Influenced by the Local Concentrations of MidGap Native Donors and Dislocations" by P. Dobrilla Appl. Phys. Lett 47(6) 15 Sep. 1985, pp. 602-604.
"Optical Mapping of Residual Stress in Czochralski Grown GaAs" by P. Dobrilla et al., App. Phys. Lett 48(19) 12 May 1986, pp. 1303-1305.
Warren, A. C. et al., "Arsenic Precipitates . . . ", Appl. Phys. Lett. 57(13), 24 Sep. 1990, pp. 1331-1333.
Sze, S. M. Physics of Semiconductor Devices, John Wiley, 1981, pp. 759, 711.
Burroughes Jeremy
Hodgson Rodney T.
McInturff David T.
Melloch Michael R.
Otsuka Nobuo
Breneman R. Bruce
Fleck Linda J.
International Business Machines - Corporation
Purdue Research Foundation
LandOfFree
Method of making a compound semiconductor having metallic inclus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of making a compound semiconductor having metallic inclus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a compound semiconductor having metallic inclus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1367231