Method of locating a fault in a logic IC device

Details Method of locating a fault in a logic IC device Method of locating a fault in a logic IC device

1991-10-07

1993-02-23

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 364578, 371 23, G01R 3128, G06F 1100

Patent

active

051893657

ABSTRACT:
A fault in a logic IC device including a plurality of logic cells is diagnosed by the use of an intentional fault. The intentional fault is introduced into a portion of logical operation data for the logic cells of the device to produce a faulty logical operation data. That portion of the logical operation data corresponds to a fault candidate which represents a location in the device at which hazard is supposed to have occurred to make it uncertain whether or not a fault exists at the location.

REFERENCES:
patent: 3702011 (1972-10-01), Armstrong
patent: 4228537 (1980-10-01), Henckels et al.
patent: 4242751 (1980-12-01), Henckels et al.
patent: 4769817 (1988-09-01), Krohn et al.
patent: 4907230 (1990-03-01), Heller et al.

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