Method of locating a calibration patch in a reference...

Registers – Records – Projections

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C235S494000

Reexamination Certificate

active

06866199

ABSTRACT:
A method of locating a reference calibration patch on a photographic element, that includes the steps of: exposing the photographic element to form a latent image of a reference calibration target having a two dimensional barcode symbol with a finder feature and a reference calibration patch having a known spatial relation to the finder feature of the two-dimensional barcode symbol; processing the photographic element to form a density image from the latent image; scanning the density image to produce a digital image; locating the finder feature of the two-dimensional barcode symbol in the digital image; and locating the reference calibration patch relative to the finder feature in the digital image.

REFERENCES:
patent: 3718074 (1973-02-01), Davis
patent: 4211558 (1980-07-01), Oguchi et al.
patent: 4260245 (1981-04-01), Hujer
patent: 4365882 (1982-12-01), Disbrow
patent: 4464045 (1984-08-01), Findeis et al.
patent: 4577961 (1986-03-01), Terashita
patent: 4634850 (1987-01-01), Pierce et al.
patent: 4786792 (1988-11-01), Pierce et al.
patent: 4874936 (1989-10-01), Chandler et al.
patent: 4881095 (1989-11-01), Shidara
patent: 4884102 (1989-11-01), Terashita
patent: 4939354 (1990-07-01), Priddy et al.
patent: 5075716 (1991-12-01), Jehan et al.
patent: 5189521 (1993-02-01), Ohtsubo et al.
patent: 5198907 (1993-03-01), Walker et al.
patent: 5267030 (1993-11-01), Giorgianni et al.
patent: 5452055 (1995-09-01), Smart
patent: 5519510 (1996-05-01), Edgar
patent: 5563717 (1996-10-01), Koeng et al.
patent: 5591956 (1997-01-01), Longacre, Jr. et al.
patent: 5649260 (1997-07-01), Wheeler et al.
patent: 5667944 (1997-09-01), Reem et al.
patent: 5698382 (1997-12-01), Nakahanada et al.
patent: 5736996 (1998-04-01), Takada et al.
patent: 5758223 (1998-05-01), Kobayashi et al.
patent: 5767983 (1998-06-01), Terashita
patent: 5832328 (1998-11-01), Ueda
patent: 5988896 (1999-11-01), Edgar
patent: 0762201 (1997-03-01), None
patent: 0926550 (1999-06-01), None
patent: 11-316448 (1999-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of locating a calibration patch in a reference... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of locating a calibration patch in a reference..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of locating a calibration patch in a reference... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3452498

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.