Method of localizing fluorescent markers

Optics: measuring and testing – With plural diverse test or art

Reexamination Certificate

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Details

C356S318000, C356S417000, C356S615000, C356S620000

Reexamination Certificate

active

07317515

ABSTRACT:
The invention describes a method of determining the position of fluorescent markers in a sample (4), with a high spatial resolution. To this end, the sample (4) is illuminated with an exciting light beam (11), while the sample (4) is simultaneously scanned by a particle beam (3). During scanning, markers will be impinged upon by the particle beam (3) and will be damaged, in such a manner that the marker impinged upon will no longer emit fluorescence radiation. This leads to a reduction of the flux of fluorescence radiation. This reduction is detected. Seeing as the position of the particle beam (3) w.r.t. the sample is known at the moment that the marker is damaged, the position of the marker in the sample is, accordingly, also known.

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patent: 5811804 (1998-09-01), Van Blitterswijk et al.
patent: 6002471 (1999-12-01), Quake
patent: 6259104 (2001-07-01), Baer
patent: 4233686 (1994-04-01), None
patent: 2596863 (2001-07-01), None
R. V. Krishman, R. Varma, and S. Mayor, “Fluorescence Methods to Probe Nanometer-Scale Organization of Molecules in Living Cell Membranes,” Journal of Fluorescence vol. 11, No. 3, Sep. 2001 pp. 211-226.

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