Method of lifting off and fabricating array substrate for...

Etching a substrate: processes – Forming groove or hole in a substrate which is subsequently...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C216S040000, C216S041000, C216S043000

Reexamination Certificate

active

07988871

ABSTRACT:
A method of lifting off includes forming a first material layer on a substrate; forming a photoresist pattern including first and second holes and on the first material layer; patterning the first material layer using the photoresist pattern as a patterning mask to form a material pattern having first and second grooves within the material pattern, the first and second grooves corresponding to the first and second holes, respectively; forming a second material layer on an entire surface of the substrate including the photoresist pattern and the first and second grooves; and removing the photoresist pattern and the second material layer on the photoresist pattern at the same time, wherein a portion of the material pattern between the first and second grooves and portions of the material pattern at sides of the first and second grooves constitute a line as a whole.

REFERENCES:
patent: 2006/0113539 (2006-06-01), Sano et al.
patent: 2006/0160340 (2006-07-01), Takei et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of lifting off and fabricating array substrate for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of lifting off and fabricating array substrate for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of lifting off and fabricating array substrate for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2653788

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.